Heerlen, Netherlands

Fraba B.v.


USPTO Granted Patents = 27


Trademarks = 7

Forward Citations = 27

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23 inventors (with patents filed for the assignee):

goldMedal Michael Loeken (10 out of 12 patents)

silverMedal Martin Forthaus (5 out of 5 patents)

bronzeMedal Florian Hallermann (4 out of 4 patents)

4.  Hanno Volker (4 out of 4 patents)

5.  Andre Quaiser (3 out of 3 patents)

6.  Dimitri Pritzkau (2 out of 2 patents)

7.  Uwe Kettering (2 out of 2 patents)

8.  Christian Leeser (2 out of 2 patents)

9.  Konrad Machill (2 out of 3 patents)

10.  Christian Fell (1 out of 1 patent)

11.  Bernd Kagerer (1 out of 2 patents)

12.  Christian Lilienthal (1 out of 2 patents)

13.  Omar Al Attar (1 out of 1 patent)

14.  Lucien Scholten (1 out of 1 patent)

15.  Andreas Backes (1 out of 1 patent)


Core Competencies:
Sensor Device
Magnetic Field
Angle-of-Rotation
Rotary Encoder
Calibration Apparatus
Fluid Flow-Rate
Magnet-Based
Displacement Measuring
Door Device
Maintenance System
Optoelectronic Safety

27 patents:

Company Overview
Fraba B.V., headquartered in Heerlen, Netherlands, specializes in advanced automation and sensing technologies. The company develops innovative solutions for various industries, including manufacturing, logistics, and robotics. Fraba's expertise lies in the design and production of sensors, encoders, and control systems that enhance operational efficiency and precision. With a focus on providing high-quality products, Fraba is committed to driving technological advancements and supporting its clients in achieving their automation goals.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

27 Patents

#3 in Heerlen

#270 in Netherlands

#24,012 in the World

Heerlen, NL
Heerlen, Netherlands
Forward Citations = 27

23 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Fraba B.v.. Retrieved from https://idiyas.com/company/fraba-b-v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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