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USPTO Data Jan 1 1976 - Oct 13 2026
19 Patents
#14 in Carrollton, TX
#1,033 in Texas
#17,138 in US
#32,663 in the World
Forney Engineering Company
Forward Citations = 792
19 inventors:
Carrollton, TX, United States of America
Forney Engineering Company
Trademarks = 3
Forward Citations = 792
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19 inventors (with patents filed for the assignee):
Billy R Slater (6 out of 9 patents)
Candelario Paredes (3 out of 5 patents)
Robert Horn (3 out of 3 patents)
4. Raymond J Slovacek (2 out of 2 patents)
5. James S Grisham, Jr (2 out of 2 patents)
6. Dennis W Simpson (2 out of 2 patents)
7. William D Stevens (1 out of 11 patents)
8. Ray Murphy (1 out of 1 patent)
9. Ross H Forney (1 out of 1 patent)
10. John W Dirriwachter (1 out of 1 patent)
11. Robert J Kelly (1 out of 1 patent)
12. William J Moore (1 out of 1 patent)
13. John K Arand (1 out of 1 patent)
14. Thomas H Holley (1 out of 1 patent)
15. Robert J George (1 out of 1 patent)
19 patents:
Company Overview
Forney Engineering Company, based in Carrollton, Texas, specializes in the development and manufacturing of advanced testing and measurement equipment for the construction and materials industries. The company focuses on providing innovative solutions that enhance quality control and ensure compliance with industry standards. With a commitment to research and technology, Forney Engineering plays a significant role in supporting infrastructure development and construction projects across various sectors.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Forney Engineering Company. Retrieved from https://idiyas.com/company/forney-engineering-company
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]