Trademarks = 9

Forward Citations = 93

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4 inventors (with patents filed for the assignee):

Don D Vaughan (3 out of 15 patents)

Edward L Altshuler (2 out of 3 patents)

Russel L Hlavenka (1 out of 1 patent)

4. Greg A Sebastian (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 5820133 - Rotary control valve and seal mechanism (1998-10-13),

2. 5816290 - Rotary control valve for a water conditioning system (1998-10-06),

3. 5741005 - Rotary disk control valve for a water conditioning system (1998-04-21),

4. 5628899 - Control mechanism for controlling regeneration of two water treatment (1997-05-13),

5. 5590687 - Control mechanism for a water conditioning system (1997-01-07),

6. 5556259 - Vortex generating fluid injector assembly (1996-09-17),

Company Overview

Fleck Controls, Inc. is a leading provider of innovative control systems for industrial applications. With over 20 years of experience in the industry, we specialize in designing and manufacturing high-quality control solutions that optimize efficiency and reliability. Our cutting-edge technology and exceptional customer service set us apart from the competition, making us a trusted partner for businesses across various sectors. Visit our website to learn more about our products and services.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

6 Patents

#16 in Brookfield, WI

#969 in Wisconsin

#44,949 in US

Brookfield, WI, United States of America

Fleck Controls, Inc.

Forward Citations = 93

4 inventors:

Don D Vaughan (3 out of 15 patents)

Edward L Altshuler (2 out of 3 patents)

Russel L Hlavenka (1 out of 1 patent)

4. Greg A Sebastian (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Fleck Controls, Inc.. Retrieved from https://idiyas.com/company/fleck-controls

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]