Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
17 Patents
#1 in Manheim, PA
#688 in Pennsylvania
#18,913 in US
#35,974 in the World
Fenner, Inc.
Forward Citations = 178
22 inventors:
Manheim, PA, United States of America
Fenner, Inc.
Calculating rank
% Expired Patents = 11.8
EPO Patents = 1
Trademarks = 6
Forward Citations = 178
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22 inventors (with patents filed for the assignee):
Randall R Geib (7 out of 7 patents)
A Ronald Hetrich (3 out of 3 patents)
William McCotter (2 out of 2 patents)
4. Carl Cura (2 out of 2 patents)
5. John P Williamson (2 out of 2 patents)
6. Peter P McCaffrey (2 out of 2 patents)
7. Boyd E Knepp (1 out of 6 patents)
8. Thomas E Hughes (1 out of 2 patents)
9. Gary Smith (1 out of 1 patent)
10. Grant Q Moyer (1 out of 1 patent)
11. Shaun A Seymour, Ii (1 out of 1 patent)
12. Susan I Trafford (1 out of 1 patent)
13. Michael H Turek (1 out of 1 patent)
14. Howard E Marshall (1 out of 1 patent)
15. John Hampton (1 out of 1 patent)
17 patents:
Company Overview
Fenner, Inc. is a leading provider of engineered solutions specializing in the design and manufacture of high-performance polymer products. The company focuses on advanced materials and technologies that serve various industries, including automotive, aerospace, and industrial applications. With a commitment to innovation, Fenner leverages its expertise in material science to develop solutions that enhance performance and reliability. Headquartered in Manheim, Pennsylvania, Fenner operates with a global perspective, catering to diverse market needs.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Fenner, Inc.. Retrieved from https://idiyas.com/company/fenner
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]