Forward Citations = 139

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6 inventors (with patents filed for the assignee):

William D Bowers (7 out of 11 patents)

Raymond L Chuan (2 out of 7 patents)

Fredrick Anvia (1 out of 1 patent)

4. John A Elton (1 out of 1 patent)

5. Frank Bahrami (1 out of 1 patent)

6. John Tran (1 out of 1 patent)

8 patents: Sort by Forward Citations

1. 6455003 - Preconcentrator for chemical detection (2002-09-24),

2. 6378385 - Pulsed air sampler (2002-04-30),

3. 6363773 - High-sensitivity instrument to measure NVR in fluids (2002-04-02),

4. 6321588 - Chemical sensor array (2001-11-27),

5. 6269703 - Pulsed air sampler (2001-08-07),

6. 6122954 - High sensitivity instrument to measure NVR in fluid (2000-09-26),

7. 5661226 - High sensitivity real-time NVR monitor (1997-08-26),

8. 5476002 - High sensitivity real-time NVR monitor (1995-12-19),

Company Overview

Femtometrics, Inc. is a cutting-edge technology company specializing in advanced sensing solutions for various industries. Our high-precision sensors are designed to detect minute particles and molecules with unparalleled accuracy. With a focus on innovation and quality, we strive to provide our clients with state-of-the-art solutions that meet their specific needs. Visit our website to learn more about our products and services.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

8 Patents

#334 in Irvine, CA

#8,531 in California

#35,893 in US

Irvine, CA, United States of America

Femtometrics, Inc.

Forward Citations = 139

6 inventors:

William D Bowers (7 out of 11 patents)

Raymond L Chuan (2 out of 7 patents)

Fredrick Anvia (1 out of 1 patent)

4. John A Elton (1 out of 1 patent)

5. Frank Bahrami (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Femtometrics, Inc.. Retrieved from https://idiyas.com/company/femtometrics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]