Vernal, UT, United States of America

Extreme Technologies, LLC


USPTO Granted Patents = 21

% Expired Patents = 9.5



Trademarks = 7

Forward Citations = 414

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12 inventors (with patents filed for the assignee):

goldMedal Gilbert Troy Meier (10 out of 10 patents)

silverMedal Craig Thomas Yehle (7 out of 61 patents)

bronzeMedal Joseph Aschenbrenner (5 out of 5 patents)

4.  Joshua J Smith (5 out of 5 patents)

5.  James D Isenhour (5 out of 6 patents)

6.  Lot William Short, Jr (3 out of 6 patents)

7.  Robert Bradley Beggs (3 out of 7 patents)

8.  Richard Earl Beggs (3 out of 7 patents)

9.  James D Osterloh (3 out of 18 patents)

10.  Cameron Dick (2 out of 2 patents)

11.  Lane Snell (1 out of 2 patents)

12.  Nicholas C Obteshka (1 out of 13 patents)

13.  Yehuda Yaniv (1 patent)

14.  Roy Ozeri (1 patent)

15.  James Daniel Isenhour (0 patent)


21 patents:

Company Overview
Extreme Technologies, LLC is a specialized firm based in Vernal, Utah, focusing on advanced technology solutions. The company is known for its innovative developments in various sectors, including energy, environmental technologies, and industrial applications. By leveraging cutting-edge research and engineering expertise, Extreme Technologies aims to provide effective solutions that address complex challenges in the market. Their commitment to quality and innovation positions them as a key player in the technology landscape.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

Extreme Technologies, LLC USPTO Patent Assignee Logo
21 Patents

#1 in Vernal, UT

#179 in Utah

#15,681 in US

#29,928 in the World

Vernal, UT (US)
Vernal, UT, United States of America
Forward Citations = 414

12 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Extreme Technologies, LLC. Retrieved from https://idiyas.com/company/extreme-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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