Elkhart, IN, United States of America

Environmental Test Systems, Inc.


USPTO Granted Patents = 10


Trademarks = 4

Forward Citations = 69

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14 inventors (with patents filed for the assignee):

goldMedal Eugenia Makowski (2 out of 2 patents)

silverMedal Yuriy Vladimirovich Evtodienko (2 out of 2 patents)

bronzeMedal Carol Ann Terry (2 out of 2 patents)

4.  Kenneth A Blake (2 out of 3 patents)

5.  Chauncey O Rupe (2 out of 3 patents)

6.  James E Christner (1 out of 8 patents)

7.  Michael A Van Lente (1 out of 5 patents)

8.  Iouri Evtodienko (1 out of 4 patents)

9.  David A N Morris (1 out of 1 patent)

10.  Boris Ivanovich Medvedev (1 out of 1 patent)

11.  Robert A Peachey-Stoner (1 out of 1 patent)

12.  Leonard J Lucchese, Ii (1 out of 1 patent)

13.  Harry Thomas Stephenson (1 out of 1 patent)

14.  Thomas Harry Kreiser (1 out of 1 patent)

15.  Lydia J Dobler (1 patent)


10 patents:

Company Overview
Environmental Test Systems, Inc. is a specialized manufacturer based in Elkhart, Indiana, focused on developing advanced environmental testing equipment. The company provides solutions for various industries, ensuring products meet rigorous environmental standards. Their expertise encompasses a range of testing technologies, including thermal, humidity, and vibration testing, which are essential for assessing the durability and reliability of products under extreme conditions. Environmental Test Systems, Inc. is committed to innovation and quality in the field of environmental testing.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

10 Patents

#25 in Elkhart, IN

#408 in Indiana

#29,839 in US

#55,986 in the World

Elkhart, IN (US)
Elkhart, IN, United States of America
Forward Citations = 69

14 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Environmental Test Systems, Inc.. Retrieved from https://idiyas.com/company/environmental-test-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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