Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
4 Patents
#582 in Austin, TX
#3,939 in Texas
#60,671 in US
Entvantage Diagnostics, Inc.
Forward Citations = 8
14 inventors:
Austin, TX, United States of America
Entvantage Diagnostics, Inc.
% Expired Patents = 75.0
EPO Patents = 1
Trademarks = 2
Forward Citations = 8
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14 inventors (with patents filed for the assignee):
Joseph Skraba (4 out of 4 patents)
Oriana E Hawkins (4 out of 4 patents)
Mohan Rajasekaran (2 out of 162 patents)
4. Aaron Szymanski (2 out of 131 patents)
5. David S Seebauer (2 out of 11 patents)
6. Rishwa Baxi (2 out of 2 patents)
7. Soumya Mohana-Sundaram (2 out of 2 patents)
8. John Wysmuller (1 out of 2 patents)
9. Michael Mennone (1 out of 2 patents)
10. Cheng-Ling Yang (1 out of 1 patent)
11. Scott Johnstone (1 out of 11 patents)
12. Zachary Hawkins (1 out of 1 patent)
13. Rebekah M Reiser (1 out of 1 patent)
14. Oscar E Okiya (1 out of 1 patent)
4 patents:
Company Overview
Entvantage Diagnostics, Inc. is a leading provider of innovative diagnostic solutions for the healthcare industry. Our cutting-edge technology and advanced testing methods ensure accurate and timely results for our clients. With a strong focus on research and development, we continue to push the boundaries of diagnostic science to improve patient outcomes and advance the field of personalized medicine. Visit our website to learn more about our services and how we can help meet your diagnostic needs.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Entvantage Diagnostics, Inc.. Retrieved from https://idiyas.com/company/entvantage-diagnostics
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]