Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
28 Patents
#1 in Rockland, MA
#715 in Massachusetts
#12,013 in US
#23,285 in the World
En-Gauge, Inc.
Forward Citations = 385
6 inventors:
Rockland, MA, United States of America
En-Gauge, Inc.
% Expired Patents = 75.0
Forward Citations = 385
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6 inventors (with patents filed for the assignee):
Brendan T McSheffrey (25 out of 37 patents)
John J McSheffrey, Jr (10 out of 13 patents)
Terrance Riedel (6 out of 7 patents)
4. John J McSheffrey (4 out of 17 patents)
5. James W Britnell (3 out of 3 patents)
6. John McSheffrey, Sr (1 out of 2 patents)
Core Competencies:
Fluid Container Management
Emergency Resource Location
Remote Monitoring
Fire Extinguisher Inspection
Oxygen Tank Monitoring
Emergency Equipment Power
Data Transmission
Object Tracking
Laser Welding Apparatus
Control System
Seam Follower
Tilting Mechanism
28 patents:
Company Overview
En-Gauge, Inc. is a technology company based in Rockland, MA, specializing in advanced solutions for the manufacturing and industrial sectors. The organization focuses on developing innovative software and hardware systems that enhance operational efficiency and productivity. With a strong emphasis on automation and data analytics, En-Gauge aims to empower businesses to optimize their processes and improve decision-making. The company is committed to delivering cutting-edge technologies that address the evolving needs of its clients in a competitive landscape.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: En-Gauge, Inc.. Retrieved from https://idiyas.com/company/en-gauge
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]