Trademarks = 1

Forward Citations = 39

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6 inventors (with patents filed for the assignee):

Christiaan E Baerts (3 out of 10 patents)

Johan M Knevels (1 out of 1 patent)

Richard F Conti (1 out of 1 patent)

4. Edwin Kaufman (1 out of 1 patent)

5. Jacques J Plessers (1 out of 6 patents)

6. Rudi Maes (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 5187991 - Device for withdrawing samples from molten metals (1993-02-23),

2. 5156799 - Sampling device for molten metal (1992-10-20),

3. 5057149 - Method and apparatus for introducing uniform quantities of a material (1991-10-15),

4. 5033320 - Device for determining phase transitions using a sample of molten metal (1991-07-23),

5. 4998432 - Apparatus and method for measuring a gas content of liquid metal and (1991-03-12),

6. 4893516 - Metal contact member for a measuring lance for taking measurements in (1990-01-16),

Company Overview

Electro-nite International Nv is a global leader in providing innovative solutions for quality control and process optimization in the steel industry. Their advanced technology and expertise help manufacturers improve production efficiency, reduce costs, and enhance product quality. With a strong focus on research and development, Electro-nite International Nv continues to drive advancements in steelmaking technology.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

6 Patents

#1 in Antwerpen

#972 in Netherlands

Antwerpen, Netherlands

Electro-Nite International Nv

Forward Citations = 39

6 inventors:

Christiaan E Baerts (3 out of 10 patents)

Johan M Knevels (1 out of 1 patent)

Richard F Conti (1 out of 1 patent)

4. Edwin Kaufman (1 out of 1 patent)

5. Jacques J Plessers (1 out of 6 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Electro-Nite International Nv. Retrieved from https://idiyas.com/company/electro-nite-international-nv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]