Company Badge
USPTO Data Jan 1 1976 - Nov 10 2026
5 Patents
#2 in Wright City, MO
#729 in Missouri
#51,743 in US
Efficient Manufacturing Systems, LLC
Forward Citations = 9
5 inventors:
Wright City, MO, United States of America
Efficient Manufacturing Systems, LLC
Calculating rank
% Expired Patents = 100.0
Forward Citations = 9
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5 inventors (with patents filed for the assignee):
Todd Rio (5 out of 8 patents)
Dave L Graves (5 out of 6 patents)
Gerard M Hellebusch (5 out of 6 patents)
4. Patrick Robert Meyer (5 out of 6 patents)
5. John A Yegge, Sr (5 out of 5 patents)
5 patents:
1. 7690416 - Apparatus and method for simultaneous usage of multiple die casting tools (2010-04-06),
2. 7559354 - Apparatus and method for simultaneous usage of multiple die casting tools (2009-07-14),
3. 7416015 - Apparatus and method for simultaneous usage of multiple die casting tools (2008-08-26),
Company Overview
Efficient Manufacturing Systems, LLC is a leading provider of innovative manufacturing solutions. We specialize in designing and implementing efficient production processes to optimize productivity and reduce costs for our clients. With a focus on quality and efficiency, we help businesses improve their manufacturing operations and stay competitive in today's market. Our team of experts offers a wide range of services, including process engineering, automation, and custom machinery design. Contact us today to learn more about how we can help your company achieve its manufacturing goals.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Efficient Manufacturing Systems, LLC. Retrieved from https://idiyas.com/company/efficient-manufacturing-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]