Lapeer, MI, United States of America

Durakon Acquisition Corp.

USPTO Granted Patents = 13

% Expired Patents = 38.5

Forward Citations = 235

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15 inventors (with patents filed for the assignee):

goldMedal R Alan Darbishire (4 out of 4 patents)

silverMedal John C Montagna (3 out of 12 patents)

bronzeMedal Donald J LaBelle (3 out of 5 patents)

4.  Thomas G Sierakowski (2 out of 5 patents)

5.  Eric R Papa (2 out of 2 patents)

6.  Vincent M McKeoun (2 out of 2 patents)

7.  R Alan Darbishire (2 out of 2 patents)

8.  Scott Brant Harder (1 out of 1 patent)

9.  Clover Suzanne Aguayo (1 out of 1 patent)

10.  Richard Euel Henderson (1 out of 1 patent)

11.  Robert Chris Tanton (1 out of 1 patent)

12.  Gerard A Whitney (1 out of 1 patent)

13.  O Theodore Gibson (1 out of 1 patent)

14.  John B Organ (1 out of 1 patent)

15.  Donald L LaBelle (1 out of 1 patent)


13 patents:

Company Overview
Durakon Acquisition Corp., based in Lapeer, Michigan, specializes in the development and manufacturing of advanced automotive components and systems. The company focuses on creating innovative solutions that enhance vehicle performance and safety. With a commitment to quality and engineering excellence, Durakon plays a significant role in the automotive supply chain, catering to various market needs. Its expertise spans across multiple domains, including materials science and manufacturing processes, positioning it as a key player in the automotive industry.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

13 Patents

#4 in Lapeer, MI

#850 in Michigan

#23,854 in US

#45,081 in the World

Lapeer, MI (US)
Lapeer, MI, United States of America
Forward Citations = 235

15 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Durakon Acquisition Corp.. Retrieved from https://idiyas.com/company/durakon-acquisition

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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