Newark, DE, United States of America

Direct Radiography Corp.

Calculating rank
USPTO Granted Patents = 20

% Expired Patents = 5.0

Forward Citations = 949

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22 inventors (with patents filed for the assignee):

goldMedal Lothar S Jeromin (4 out of 24 patents)

silverMedal James E Davis (4 out of 29 patents)

bronzeMedal Denny L Lee (3 out of 24 patents)

4.  Denny L Y Lee (3 out of 4 patents)

5.  Cornell L Williams (3 out of 4 patents)

6.  Brian Rodricks (2 out of 6 patents)

7.  Gregory F Powell (2 out of 2 patents)

8.  Eric L Gingold (2 out of 2 patents)

9.  Chuande Liu (2 out of 2 patents)

10.  Kelly P Golden (2 out of 2 patents)

11.  George D Robinson (2 out of 10 patents)

12.  Joseph Anthony Perrotto (1 out of 21 patents)

13.  Michael Hoffberg (1 out of 4 patents)

14.  Kelly Sue Herbst (1 out of 1 patent)

15.  Robert Montgomery Taylor (1 out of 1 patent)


20 patents:

Company Overview
Direct Radiography Corp. is a technology company based in Newark, Delaware, specializing in advanced imaging solutions. The organization focuses on the development and manufacturing of digital radiography systems, which are essential in various medical and industrial applications. By leveraging innovative technologies, Direct Radiography Corp. aims to enhance diagnostic capabilities and improve workflow efficiency in healthcare settings. Their expertise in imaging technology positions them as a key player in the medical device sector.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Nov 10 2026

20 Patents

#16 in Newark, DE

#270 in Delaware

#16,444 in US

#31,380 in the World

Newark, DE (US)
Newark, DE, United States of America
Forward Citations = 949

22 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Direct Radiography Corp.. Retrieved from https://idiyas.com/company/direct-radiography

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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