Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
17 Patents
#1 in Bucks
#1,059 in United Kingdom
#35,948 in the World
Diametrics Medical Limited
Forward Citations = 1,719
22 inventors:
Diametrics Medical Limited
% Expired Patents = 11.8
Trademarks = 1
Forward Citations = 1,719
Loading Chart...
Loading Chart...
22 inventors (with patents filed for the assignee):
Kee Van Sin (6 out of 16 patents)
Carter R Anderson (6 out of 6 patents)
David W Deetz (5 out of 5 patents)
4. Russell L Morris (5 out of 5 patents)
5. Martin G Hieb (3 out of 3 patents)
6. David R Markle (2 out of 30 patents)
7. James D Kurkowski (2 out of 2 patents)
8. Scott E Blomberg (2 out of 2 patents)
9. Kathleen A Eischen (1 out of 2 patents)
10. James W Kenney (1 out of 24 patents)
11. Stuart Hendry (1 out of 1 patent)
12. Derek Chapman (1 out of 1 patent)
13. David T Giddings (1 out of 2 patents)
14. Robbi T Thompson (1 out of 2 patents)
15. Walter L Sembrowich (1 out of 2 patents)
17 patents:
Company Overview
Diametrics Medical Limited is a UK-based company specializing in the development and manufacturing of advanced medical devices. The organization focuses on innovative solutions for critical care and point-of-care diagnostics, enhancing patient management and treatment outcomes. With a commitment to quality and precision, Diametrics leverages cutting-edge technology to address the evolving needs of healthcare professionals and improve clinical workflows. Its expertise spans various aspects of medical instrumentation, positioning it as a key player in the healthcare technology sector.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Diametrics Medical Limited. Retrieved from https://idiyas.com/company/diametrics-medical
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]