% Expired Patents = 100.0

Forward Citations = 22

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10 inventors (with patents filed for the assignee):

David H Titzler (4 out of 34 patents)

Heather Fleming (3 out of 6 patents)

Brian Whitney Lamb (3 out of 10 patents)

4. John Edwin Johnston (2 out of 32 patents)

5. Edward J Cooper (2 out of 30 patents)

6. Andrew G Butler (2 out of 33 patents)

7. Christopher Tacklind (1 out of 34 patents)

8. Wilfred H Anderson (1 out of 4 patents)

9. Jeff Hayashida (1 out of 2 patents)

10. Christopher Tackind (1 out of 2 patents)

4 patents: Sort by Forward Citations

1. 8033033 - Layered beam measurement apparatus (2011-10-11),

2. 8033029 - Multi-reel marking apparatus (2011-10-11),

3. 7805850 - Extendable edge reference tool (2010-10-05),

4. 7730630 - Layered beam measurement apparatus (2010-06-08),

Company Overview

Design To Manufacturing, Inc. is a leading full-service design and manufacturing company specializing in custom products for a wide range of industries. With a team of experienced engineers and state-of-the-art facility, we offer end-to-end solutions from concept to production. Our services include product design, prototyping, tooling, and manufacturing, ensuring high-quality products that meet our clients' specifications and timelines.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

4 Patents

#450 in Mountain View, CA

#14,051 in California

#60,641 in US

Mountain View, CA, United States of America

Design to Manufacturing, Inc.

Forward Citations = 22

10 inventors:

David H Titzler (4 out of 34 patents)

Heather Fleming (3 out of 6 patents)

Brian Whitney Lamb (3 out of 10 patents)

4. John Edwin Johnston (2 out of 32 patents)

5. Edward J Cooper (2 out of 30 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Design to Manufacturing, Inc.. Retrieved from https://idiyas.com/company/design-to-manufacturing

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]