Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
8 Patents
#14 in Fenton, MO
#517 in Missouri
#35,954 in US
Custom Sensors and Technology
Forward Citations = 32
15 inventors:
Fenton, MO, United States of America
Custom Sensors and Technology
Calculating rank
% Expired Patents = 25.0
Forward Citations = 32
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15 inventors (with patents filed for the assignee):
Mike Ponstingl (5 out of 7 patents)
Jess V Ford (4 out of 17 patents)
Sean Michael Christian (3 out of 23 patents)
4. Sven Kruger (3 out of 4 patents)
5. Bryan William Kasperski (3 out of 22 patents)
6. Margaret C Waid (3 out of 34 patents)
7. Richard Nordman (2 out of 2 patents)
8. Enrique Prati (2 out of 4 patents)
9. Anthony F Johnson (2 out of 5 patents)
10. Leslie Wolff (1 out of 2 patents)
11. Alexander R Stephens (1 out of 1 patent)
12. Michael B Stephens (1 out of 1 patent)
13. Entique Prati (1 out of 1 patent)
14. Michael James Ponstingl (1 out of 6 patents)
15. Thomas Mark Kornblum (1 out of 3 patents)
8 patents:
Company Overview
Custom Sensors and Technology is a leading provider of customized sensor solutions for a variety of industries. With a team of experienced engineers and designers, the company specializes in developing sensors that meet the specific needs of its clients. From temperature sensors to pressure sensors, Custom Sensors and Technology offers a wide range of innovative products to help businesses improve efficiency and productivity.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Custom Sensors and Technology. Retrieved from https://idiyas.com/company/custom-sensors-and-technology
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]