% Expired Patents = 25.0

Forward Citations = 56

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4 inventors (with patents filed for the assignee):

Michael James Ponstingl (4 out of 6 patents)

Robert C Kessler (3 out of 3 patents)

Walter N Trump (3 out of 3 patents)

4. Anthony F Johnson (1 out of 5 patents)

4 patents: Sort by Forward Citations

1. 7382458 - Fiber optic fluid probe (2008-06-03),

2. 5408313 - Optical interface coupler and system for photometric analysis (1995-04-18),

3. 5241368 - Fiber-optic probe for absorbance and turbidity measurement (1993-08-31),

4. 4637730 - Optical and electronically compared absorptiometer (1987-01-20),

Company Overview

Custom Sample Systems, Inc. is a leading provider of custom-designed sample systems for gas and liquid analysis in industrial settings. With over 20 years of experience, we specialize in creating efficient and reliable sampling solutions tailored to each client's specific needs. Our team of expert engineers and technicians work closely with customers to design, fabricate, and install systems that optimize performance and accuracy. From process analyzers to environmental monitoring, Custom Sample Systems ensures precision and quality in every project.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

4 Patents

#30 in Fenton, MO

#855 in Missouri

#60,671 in US

Fenton, MO, United States of America

Custom Sample Systems, Inc.

Forward Citations = 56

4 inventors:

Michael James Ponstingl (4 out of 6 patents)

Robert C Kessler (3 out of 3 patents)

Walter N Trump (3 out of 3 patents)

4. Anthony F Johnson (1 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Custom Sample Systems, Inc.. Retrieved from https://idiyas.com/company/custom-sample-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]