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USPTO Data Jan 1 1976 - Oct 13 2026
16 Patents
#12 in Fairfield, NJ
#755 in New Jersey
#19,922 in US
#37,831 in the World
Curtiss Wright Flight Systems, Inc.
Forward Citations = 305
15 inventors:
Fairfield, NJ, United States of America
Curtiss Wright Flight Systems, Inc.
Forward Citations = 305
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15 inventors (with patents filed for the assignee):
Robert K Tiedeman (5 out of 5 patents)
Gary S Ruschke (4 out of 4 patents)
William Hickerson (3 out of 11 patents)
4. Bradley C Litz (3 out of 3 patents)
5. Edward A Mayer (2 out of 3 patents)
6. Desi J Fulenta (1 out of 1 patent)
7. John D McCarthy (1 out of 4 patents)
8. Michael A Palma (1 out of 1 patent)
9. Arnold G Seipel (1 out of 1 patent)
10. William C Leuze (1 out of 1 patent)
11. Richard S Smarz (1 out of 1 patent)
12. Eric Wendling (1 out of 1 patent)
13. Frank J Tartaglia (1 out of 1 patent)
14. William R Hickerson (1 out of 1 patent)
15. William Reilly (1 out of 1 patent)
16 patents:
Company Overview
Curtiss Wright Flight Systems, Inc. is a prominent player in the aerospace and defense sectors, specializing in advanced technologies for flight control systems, avionics, and mission-critical applications. The company focuses on developing innovative solutions that enhance the safety, reliability, and performance of aircraft and defense systems. With a strong commitment to engineering excellence, Curtiss Wright serves a global market, providing cutting-edge products that meet the evolving needs of military and commercial aviation.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Curtiss Wright Flight Systems, Inc.. Retrieved from https://idiyas.com/company/curtiss-wright-flight-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]