Fenton, MI, United States of America

Contour Fabricators, Inc.


USPTO Granted Patents = 14

% Expired Patents = 64.3


Forward Citations = 182

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16 inventors (with patents filed for the assignee):

goldMedal Richard A Weaver (7 out of 13 patents)

silverMedal Michael W Czop (6 out of 8 patents)

bronzeMedal Samba Toure (3 out of 11 patents)

4.  Michael G Howe (3 out of 3 patents)

5.  John W Schaefer (3 out of 3 patents)

6.  Joseph M Wright (3 out of 10 patents)

7.  Terry M Byers (2 out of 4 patents)

8.  Nathan M Sokolowski (2 out of 3 patents)

9.  Joseph M Gabriele (2 out of 6 patents)

10.  Mark S Grajek (1 out of 1 patent)

11.  Christopher J C Zimmerman (1 out of 1 patent)

12.  Wojciech M Porcek (1 out of 1 patent)

13.  Jeremy J Weidner (1 out of 1 patent)

14.  Daniel D Hayes (1 out of 1 patent)

15.  William Joseph Gabriele (1 out of 1 patent)


14 patents:

Company Overview
Contour Fabricators, Inc. is a specialized manufacturer based in Fenton, Michigan, focusing on advanced fabrication solutions. The company excels in developing custom components and systems, primarily serving the automotive and industrial sectors. With a commitment to innovation, Contour Fabricators integrates cutting-edge technologies to enhance product performance and efficiency. Their expertise spans various domains, including precision machining and assembly, positioning them as a key player in the competitive landscape of manufacturing.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

14 Patents

#1 in Fenton, MI

#789 in Michigan

#22,333 in US

#42,290 in the World

Fenton, MI (US)
Fenton, MI, United States of America
Forward Citations = 182

16 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Contour Fabricators, Inc.. Retrieved from https://idiyas.com/company/contour-fabricators

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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