Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
9 Patents
#12 in Renton, WA
#755 in Washington
#32,605 in US
Cna Manufacturing Systems, Inc.
Forward Citations = 111
13 inventors:
Renton, WA, United States of America
Cna Manufacturing Systems, Inc.
Trademarks = 1
Forward Citations = 111
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13 inventors (with patents filed for the assignee):
Larry R Cook (5 out of 5 patents)
Mark S Soderberg (4 out of 13 patents)
Robert A Starr (3 out of 12 patents)
4. Philip A Rink (3 out of 11 patents)
5. Justin Somers Stamen (2 out of 2 patents)
6. Brian Lee Miller (2 out of 2 patents)
7. Steven Heath Mason (2 out of 2 patents)
8. Kenneth O'Neil Kelly (2 out of 2 patents)
9. Robert J Thomas (2 out of 2 patents)
10. Jeffrey R Gueble (2 out of 2 patents)
11. Robert B Erley (1 out of 1 patent)
12. Jeffrey A Sterk (1 out of 1 patent)
13. Joseph P Giamona (1 out of 1 patent)
9 patents:
Company Overview
Cna Manufacturing Systems, Inc. is a leading provider of manufacturing solutions for companies in various industries. With a strong focus on innovation and quality, Cna Manufacturing Systems offers a wide range of products and services including automation solutions, equipment design, and production monitoring systems. Their experienced team works closely with clients to develop customized solutions that meet their specific needs and improve their overall efficiency and productivity.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Cna Manufacturing Systems, Inc.. Retrieved from https://idiyas.com/company/cna-manufacturing-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]