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USPTO Data Jan 1 1976 - Oct 6 2026
10 Patents
#9 in Lawrenceville, GA
#580 in Georgia
#29,839 in US
#55,986 in the World
Cm Systems, LLC
Forward Citations = 46
14 inventors:
Lawrenceville, GA, United States of America
Cm Systems, LLC
Trademarks = 1
Forward Citations = 46
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14 inventors (with patents filed for the assignee):
Robert Bradford Gray (6 out of 9 patents)
Allan J Heffron (4 out of 4 patents)
Douglas Brown Dillard (3 out of 3 patents)
4. David Alan Spencer (3 out of 3 patents)
5. John Ashwell Raymond (3 out of 3 patents)
6. Adam Parrott (2 out of 2 patents)
7. Mary Nicole Veitch (2 out of 2 patents)
8. Thomas Gibson Woodbury (2 out of 2 patents)
9. Arthur L Estry (1 out of 1 patent)
10. William F Chalmers (1 out of 1 patent)
11. Leverne H Kennedy (1 out of 1 patent)
12. Henry J Garnaat (1 out of 1 patent)
13. Laverne H Kennedy (1 out of 1 patent)
14. Thomas Schmitt (1 out of 1 patent)
10 patents:
2. 12264877 - Automated temperature logging and predictive alerting system with timed logs (2025-04-01),
Company Overview
Cm Systems, LLC is a technology-focused company based in Lawrenceville, GA, specializing in advanced systems integration and software solutions. The organization is dedicated to developing innovative products that enhance operational efficiency across various sectors, including industrial automation and data management. With a commitment to research and development, Cm Systems leverages cutting-edge technologies to address complex challenges, providing tailored solutions that meet the evolving needs of its clients.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Cm Systems, LLC. Retrieved from https://idiyas.com/company/cm-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]