Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
74 Patents
#99 in Paris
#350 in France
#10,140 in the World
Christian Dior Couture
Forward Citations = 320
6 inventors:
Christian Dior Couture
Calculating rank
Trademarks = 6
Forward Citations = 320
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6 inventors (with patents filed for the assignee):
Victoire De Castellane (35 out of 39 patents)
Mathieu Jamin (32 out of 95 patents)
Maria Grazia Chiuri (3 out of 19 patents)
4. Kim Jones (2 out of 7 patents)
5. Sidney Toledano (1 out of 1 patent)
6. Sabrina Bonesi (1 out of 3 patents)
Core Competencies:
Earring
Necklace
Bracelet
Ring
Sunglasses
Footwear
Spectacles
Handbag
Jewelry Item
Articulation Arrangement
Cuff Bracelet
Article of Jewelry
74 patents:
Company Overview
Christian Dior Couture, headquartered in Paris, France, is a leading luxury fashion house renowned for its exquisite jewelry design and high-end accessories. The company specializes in creating a diverse range of products, including earrings, necklaces, bracelets, rings, sunglasses, footwear, spectacles, and handbags. With a commitment to craftsmanship and innovation, Dior continues to set trends in the luxury market, blending traditional techniques with contemporary aesthetics to deliver iconic pieces that resonate with discerning clientele worldwide.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Christian Dior Couture. Retrieved from https://idiyas.com/company/christian-dior-couture
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]