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USPTO Data Jan 1 1976 - Oct 20 2026
10 Patents
#52 in Minnetonka, MN
#850 in Minnesota
#29,882 in US
#56,092 in the World
Check Technology Corporation
Forward Citations = 101
15 inventors:
Minnetonka, MN, United States of America
Check Technology Corporation
Forward Citations = 101
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15 inventors (with patents filed for the assignee):
Jay R Peterson (7 out of 7 patents)
Michael M Richardson (7 out of 18 patents)
Eugene G Weiss (6 out of 6 patents)
4. Kent Gorham (5 out of 5 patents)
5. Gary Thomas Schultze (4 out of 8 patents)
6. Chris J Vetter (4 out of 4 patents)
7. Allan C Brittle, Jr (4 out of 4 patents)
8. Lee B Fiedler (3 out of 3 patents)
9. Thomas J McDonough (2 out of 10 patents)
10. Roger D McCumber (1 out of 10 patents)
11. Gerry A Lee (1 out of 2 patents)
12. Gregg F Kubisiak (1 out of 1 patent)
13. Glenn H Heiller (1 out of 3 patents)
14. Thomas L Peterson (1 out of 1 patent)
15. Michael P Petersen (1 out of 1 patent)
10 patents:
Company Overview
Check Technology Corporation, based in Minnetonka, MN, specializes in advanced technology solutions focused on enhancing operational efficiency and safety across various industries. The company is known for its innovative approaches in developing software and hardware systems that streamline processes and improve data management. With a commitment to research and development, Check Technology Corporation aims to deliver cutting-edge solutions that address the evolving needs of its clients in a dynamic technological landscape.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Check Technology Corporation. Retrieved from https://idiyas.com/company/check-technology
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]