New York, NY, United States of America

Certco, Inc.

Calculating rank
USPTO Granted Patents = 24

% Expired Patents = 20.8

Forward Citations = 3,512

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21 inventors (with patents filed for the assignee):

goldMedal Marcel Mordechay Yung (10 out of 56 patents)

silverMedal Frank Wells Sudia (10 out of 12 patents)

bronzeMedal Yair Frankel (8 out of 36 patents)

4.  Charles Thomas Montgomery (7 out of 7 patents)

5.  David W Kravitz (7 out of 66 patents)

6.  Richard Ankney (4 out of 4 patents)

7.  Peter C Freund (3 out of 14 patents)

8.  Alan Asay (3 out of 3 patents)

9.  Ernest F Brickell (3 out of 5 patents)

10.  Frank W Sudia (3 out of 3 patents)

11.  Paul Alexandre Turner (2 out of 4 patents)

12.  Stuart T F Huang (1 out of 2 patents)

13.  Brian Siritzky (1 out of 1 patent)

14.  Stuart Stubblebine (1 out of 1 patent)

15.  Allen Claxton (1 out of 1 patent)


24 patents:

Company Overview
Certco, Inc. is a New York-based company specializing in the development and manufacturing of advanced certification and testing solutions. The organization focuses on providing innovative technologies that enhance product safety and compliance across various industries. With a commitment to quality and reliability, Certco plays a crucial role in ensuring that products meet stringent regulatory standards, thereby facilitating market access and consumer trust. Their expertise spans multiple sectors, including electronics, automotive, and industrial applications.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

24 Patents

#355 in New York, NY

#827 in New York

#13,900 in US

#26,701 in the World

New York, NY (US)
New York, NY, United States of America
Forward Citations = 3,512

21 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Certco, Inc.. Retrieved from https://idiyas.com/company/certco

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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