Company Badge
USPTO Data Jan 1 1976 - Nov 10 2026
8 Patents
#1 in Cantonment, FL
#1,097 in Florida
#36,017 in US
Cerex Advanced Fabrics, Inc.
Forward Citations = 73
10 inventors:
Cantonment, FL, United States of America
Cerex Advanced Fabrics, Inc.
Calculating rank
% Expired Patents = 37.5
Trademarks = 8
Forward Citations = 73
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10 inventors (with patents filed for the assignee):
Albert E Ortega (8 out of 24 patents)
R Wayne Thomley (4 out of 6 patents)
Charles F Shafer (3 out of 3 patents)
4. Jan Mackey (2 out of 4 patents)
5. Robert T Francis (2 out of 2 patents)
6. Daniel Baillie (1 out of 1 patent)
7. Erin Sutton Carter (1 out of 1 patent)
8. J Don Edgar (1 out of 1 patent)
9. Robert A Butler (1 out of 1 patent)
10. William T Gill (1 out of 1 patent)
8 patents:
Company Overview
Cerex Advanced Fabrics, Inc. is a leading manufacturer of high-performance technical fabrics for a wide range of industries including aerospace, automotive, healthcare, and more. With a focus on innovation and quality, Cerex offers solutions that exceed customer expectations and deliver superior performance. Visit our website to learn more about our advanced fabric capabilities.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Cerex Advanced Fabrics, Inc.. Retrieved from https://idiyas.com/company/cerex-advanced-fabrics
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]