% Expired Patents = 25.0

EPO Patents = 2

Trademarks = 6

Forward Citations = 94

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4 inventors (with patents filed for the assignee):

Mark Rutenberg (4 out of 10 patents)

Stephen Frist (4 out of 5 patents)

Robert Tjon (1 out of 6 patents)

4. Richard Jonathan Scott (1 out of 11 patents)

5. Joel Recht (2 patents)

6. Stephen Frist (2 patents)

7. Drore Eisen (4 patents)

8. Neal M Lonky (1 patent)

9. Jeremy James Michael Papadopoulos (0 patent)

4 patents: Sort by Forward Citations

1. 9068975 - Computerized detection of laryngopharyngeal reflux (2015-06-30),

2. 8199997 - Feature dependent extended depth of focusing on semi-transparent biological specimens (2012-06-12),

3. 7004913 - Retractable brush for use with endoscope for brush biopsy (2006-02-28),

4. 6676609 - Retractable brush for use with endoscope for brush biopsy (2004-01-13),

Company Overview

CDx Laboratories, Inc. is a leading biotechnology company that specializes in developing innovative diagnostic tools for detecting a variety of diseases and health conditions. Our cutting-edge technology and advanced research capabilities allow us to provide accurate and reliable testing solutions to improve patient outcomes. With a focus on precision medicine, we are dedicated to advancing the field of molecular diagnostics to support personalized treatment plans for individuals worldwide.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

4 Patents

#11 in Suffern, NY

#3,682 in New York

#60,671 in US

Suffern, NY, United States of America

Cdx Laboratories, Inc.

Forward Citations = 94

4 inventors:

Mark Rutenberg (4 out of 10 patents)

Stephen Frist (4 out of 5 patents)

Robert Tjon (1 out of 6 patents)

4. Richard Jonathan Scott (1 out of 11 patents)

5. Joel Recht (2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Cdx Laboratories, Inc.. Retrieved from https://idiyas.com/company/cdx-laboratories

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

2 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]