Company Badge
USPTO Data Jan 1 1976 - Oct 6 2026
7 Patents
#4 in Flower Mound, TX
#2,551 in Texas
#39,879 in US
Capstone Metering LLC
Forward Citations = 73
9 inventors:
Flower Mound, TX, United States of America
Capstone Metering LLC
% Expired Patents = 14.3
CIPO Patents = 1
Forward Citations = 73
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9 inventors (with patents filed for the assignee):
James Scott Williamson (7 out of 7 patents)
Walter Scott Williamson (7 out of 7 patents)
Jack Ryan Williamson (5 out of 5 patents)
4. David James Carlos Dunn (4 out of 4 patents)
5. Kevin Peter Kowalchuk (4 out of 4 patents)
6. Stephen W Smith (2 out of 41 patents)
7. Joshua Malone (1 out of 22 patents)
8. John Michael Killmeyer (1 out of 2 patents)
9. Walton Scott Corbitt (1 out of 1 patent)
10. Stephen Williams Smith (0 patent)
11. Joshua James Malone (0 patent)
12. David James Dunn (0 patent)
7 patents:
Company Overview
Capstone Metering LLC is a leading provider of advanced metering solutions for utilities and municipalities. The company offers cutting-edge technology and reliable metering products to enable efficient water and energy management. With a commitment to innovation and customer satisfaction, Capstone Metering is dedicated to helping its clients optimize their resources and improve operational efficiency.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Capstone Metering LLC. Retrieved from https://idiyas.com/company/capstone-metering
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]