Hatfield, PA, United States of America

Brooks Instrument, LLC


USPTO Granted Patents = 22

% Expired Patents = 18.2



Trademarks = 13

Forward Citations = 239

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37 inventors (with patents filed for the assignee):

goldMedal John Michael Lull (6 out of 38 patents)

silverMedal Chiun Wang (5 out of 22 patents)

bronzeMedal Stephen P Glaudel (3 out of 3 patents)

4.  Walter Dennis Robertson, Iii (3 out of 6 patents)

5.  Jay J Mendelson (3 out of 24 patents)

6.  William S Valentine (3 out of 15 patents)

7.  John R Laverack (2 out of 72 patents)

8.  Andrew C Dymek (2 out of 3 patents)

9.  Christopher George Reed (2 out of 7 patents)

10.  Michael W Fortner (2 out of 4 patents)

11.  Joseph Sipka (2 out of 2 patents)

12.  Doug B Winner (2 out of 2 patents)

13.  Joseph Corrado (2 out of 2 patents)

14.  Christophe Ellec (1 out of 7 patents)

15.  Stuart A Tison (1 out of 9 patents)


22 patents:

Company Overview
Brooks Instrument, LLC, based in Hatfield, PA, specializes in precision fluid measurement and control solutions. The company develops a range of products, including mass flow meters, controllers, and level measurement devices, primarily serving industries such as semiconductor manufacturing, pharmaceuticals, and biotechnology. With a strong emphasis on innovation, Brooks Instrument focuses on enhancing process efficiency and accuracy through advanced technologies, contributing to the optimization of critical applications across various sectors.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

Brooks Instrument, LLC USPTO Patent Assignee Logo
22 Patents

#4 in Hatfield, PA

#550 in Pennsylvania

#15,051 in US

#28,807 in the World

Hatfield, PA (US)
Hatfield, PA, United States of America
Forward Citations = 239

37 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Brooks Instrument, LLC. Retrieved from https://idiyas.com/company/brooks-instrument

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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