Beyond 3, Inc.

Calculating rank

USPTO Granted Patents = 6

% Expired Patents = 66.7

Forward Citations = 129

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2 inventors (with patents filed for the assignee):

Bryan Clark (6 out of 17 patents)

Andrei Brunfeld (1 out of 21 patents)

6 patents: Sort by Forward Citations

1. 6879421 - Method and system for performing swept-wavelength measurements within an optical system incorporating a reference resonator (2005-04-12),

2. 6778307 - Method and system for performing swept-wavelength measurements within an optical system (2004-08-17),

3. 6717707 - Method and system for controlling resonance within a resonator-enhanced optical system (2004-04-06),

4. 6714295 - Optical inspection method and apparatus having an enhanced height sensitivity region and roughness filtering (2004-03-30),

5. 6700840 - Optical storage method and apparatus having enhanced resolution (2004-03-02),

6. 6653649 - Optical measurement and inspection method and apparatus having enhanced optical path difference detection (2003-11-25),

Company Overview

Beyond 3, Inc. is a leading provider of innovative technology solutions for businesses. With a focus on driving growth and efficiency, Beyond 3 offers a range of services from IT consulting to software development. Their team of experts work closely with clients to deliver tailored solutions that meet their unique needs. Backed by years of experience and a commitment to excellence, Beyond 3 empowers businesses to thrive in the digital age.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

6 Patents

#247 in Fremont, CA

#10,583 in California

#45,030 in US

Fremont, CA, United States of America

Beyond 3, Inc.

Forward Citations = 129

2 inventors:

Bryan Clark (6 out of 17 patents)

Andrei Brunfeld (1 out of 21 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Beyond 3, Inc.. Retrieved from https://idiyas.com/company/beyond-3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]