% Expired Patents = 40.0

CIPO Patents = 1

EPO Patents = 12

Forward Citations = 15

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4 inventors (with patents filed for the assignee):

Alfred Boehm (5 out of 8 patents)

Wilhelm Binder (2 out of 4 patents)

Valeri Keller (1 out of 1 patent)

4. Hans-Peter Amann (1 out of 1 patent)

5. Alfred Böhm (1 patent)

6. Dieter Lerach (0 patent)

7. Gerhard Alois Kappl (0 patent)

8. Martin Nagl (0 patent)

9. Marco Schramel (0 patent)

10. Rudolf Grünert (0 patent)

5 patents: Sort by Forward Citations

1. 8308348 - Device for determining the dew-point temperature of a test gas (2012-11-13),

2. 8196904 - Device for discharging liquid from a tank and method for emptying the residue from a line section (2012-06-12),

3. 8172457 - Method and sensor for determining the hydrocarbon dew point in a gas (2012-05-08),

4. 8102269 - Approach warning system for detecting when a person approaches an object, particularly a machine (2012-01-24),

5. 8056425 - Device and method for detecting a volume while receiving and/or discharging a fluid having a gas portion (2011-11-15),

Company Overview

Bartec Benke specializes in the development and production of high-quality measuring and analytical devices for the oil and gas industry. With over 60 years of experience, the company is a leading provider of solutions for level, temperature, and density measurement in harsh environments. Their innovative products help customers optimize processes and ensure safety and efficiency in their operations.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

5 Patents

#331 in Reinbek/Hamburg

#6,102 in Germany

Reinbek/Hamburg, Germany

Bartec Benke Gmbh

Forward Citations = 15

4 inventors:

Alfred Boehm (5 out of 8 patents)

Wilhelm Binder (2 out of 4 patents)

Valeri Keller (1 out of 1 patent)

4. Hans-Peter Amann (1 out of 1 patent)

5. Alfred Böhm (1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Bartec Benke Gmbh. Retrieved from https://idiyas.com/company/bartec-benke

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

12 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]