Columbus, OH, United States of America

Bartec Corporation


USPTO Granted Patents = 12

% Expired Patents = 33.3


Trademarks = 2

Forward Citations = 73

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14 inventors (with patents filed for the assignee):

goldMedal Karl-Heinz Lux (4 out of 8 patents)

silverMedal Reinhold Barlian (4 out of 15 patents)

bronzeMedal Hans-Martin Lösch (2 out of 3 patents)

4.  Alfred Boehm (2 out of 8 patents)

5.  Ewald Warmuth (2 out of 2 patents)

6.  Necip Berme (1 out of 114 patents)

7.  Emre Akbas (1 out of 11 patents)

8.  Muhammed Kocabas (1 out of 3 patents)

9.  Muhammed Salih Karagoz (1 out of 3 patents)

10.  Wolfgang Emmert (1 out of 1 patent)

11.  Sebastian Kuhn (1 out of 1 patent)

12.  Ralph Lanig (1 out of 1 patent)

13.  Thomas Michelbach (1 out of 2 patents)

14.  Michel Barloy (1 out of 1 patent)

15.  Alfred Böhm (1 patent)


12 patents:

Company Overview
Bartec Corporation, based in Columbus, OH, specializes in the development and manufacturing of advanced technology solutions for various industries. The company focuses on providing innovative products and services that enhance operational efficiency and safety. With a strong emphasis on research and development, Bartec is recognized for its expertise in areas such as industrial automation, process control, and specialized equipment for hazardous environments. Their commitment to quality and innovation positions them as a key player in the technology landscape.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

Bartec Corporation USPTO Patent Assignee Logo
12 Patents

#69 in Columbus, OH

#1,069 in Ohio

#25,578 in US

#48,209 in the World

Columbus, OH (US)
Columbus, OH, United States of America
Forward Citations = 73

14 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Bartec Corporation. Retrieved from https://idiyas.com/company/bartec

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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