Bagel Labs Co., Ltd.

Calculating rank

USPTO Granted Patents = 6

% Expired Patents = 33.3

EPO Patents = 1

Trademarks = 1

Forward Citations = 17

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7 inventors (with patents filed for the assignee):

Jung Hoon Hwang (3 out of 9 patents)

Sung Seek Ham (3 out of 3 patents)

Soo-Hong Park (3 out of 4 patents)

4. Jun Young Park (3 out of 37 patents)

5. Myung Jong Kim (3 out of 13 patents)

6. Min Ki Son (2 out of 2 patents)

7. Eun Young Choi (1 out of 21 patents)

6 patents: Sort by Forward Citations

1. D941689 - Length measuring apparatus (2022-01-25),

2. 10928175 - Length measuring device (2021-02-23),

3. 10775144 - Length measuring device (2020-09-15),

4. 10443996 - Length measuring device and control method thereof (2019-10-15),

5. 10393497 - Length measuring device (2019-08-27),

6. 10393490 - Length measuring device and length measuring system (2019-08-27),

Company Overview

Bagel Labs Co., Ltd. is a technology company specializing in creating innovative smart tools for everyday use. Their flagship product, the Bagel Smart Tape Measure, revolutionizes the way measurements are taken with its digital capabilities. With a focus on practical solutions and user-friendly design, Bagel Labs aims to simplify tasks and improve efficiency in various industries. Visit their website to learn more about their products and services.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

6 Patents

#86 in Seongnam

#1,618 in South Korea

Seongnam, South Korea

Bagel Labs Co., Ltd.

Forward Citations = 17

7 inventors:

Jung Hoon Hwang (3 out of 9 patents)

Sung Seek Ham (3 out of 3 patents)

Soo-Hong Park (3 out of 4 patents)

4. Jun Young Park (3 out of 37 patents)

5. Myung Jong Kim (3 out of 13 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Bagel Labs Co., Ltd.. Retrieved from https://idiyas.com/company/bagel-labs-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]