Norco, CA, United States of America

Avid Identification Systems, Inc.


USPTO Granted Patents = 15

% Expired Patents = 6.7



Trademarks = 1

Forward Citations = 389

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14 inventors (with patents filed for the assignee):

goldMedal Martin S H Ma (4 out of 4 patents)

silverMedal Peter Troesch (4 out of 7 patents)

bronzeMedal William H Ward (4 out of 13 patents)

4.  Mark Blair (3 out of 3 patents)

5.  Jay Yoakum (3 out of 4 patents)

6.  Gui-Yang Lu (2 out of 6 patents)

7.  Nathaniel Polish (1 out of 12 patents)

8.  Michael L Beigel (1 out of 37 patents)

9.  Robert E Malm (1 out of 25 patents)

10.  Steven R Frank (1 out of 17 patents)

11.  Michael F Cruz (1 out of 3 patents)

12.  Timothy Jon Ward (1 out of 1 patent)

13.  Guiyang Lu (1 out of 1 patent)

14.  Timothy J Ward (1 out of 1 patent)

15.  Martin SH Ma (0 patent)


15 patents:

Company Overview
Avid Identification Systems, Inc. is a technology company based in Norco, California, specializing in advanced identification solutions. The company focuses on developing and manufacturing innovative products for various sectors, including law enforcement, healthcare, and education. Avid's expertise lies in biometric identification, credentialing systems, and secure data management, providing organizations with tools to enhance security and streamline operations. Their commitment to research and development ensures they remain at the forefront of identification technology.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

15 Patents

#2 in Norco, CA

#5,031 in California

#21,068 in US

#39,959 in the World

Norco, CA (US)
Norco, CA, United States of America
Forward Citations = 389

14 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Avid Identification Systems, Inc.. Retrieved from https://idiyas.com/company/avid-identification-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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