Sycamore, IL, United States of America

Auto Meter Products, Inc.

Calculating rank
USPTO Granted Patents = 23


Trademarks = 26

Forward Citations = 796

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24 inventors (with patents filed for the assignee):

goldMedal Michael R Gathman (6 out of 6 patents)

silverMedal Dale B Henningson (5 out of 11 patents)

bronzeMedal John V Westberg (4 out of 4 patents)

4.  Timothy D Joyce (4 out of 4 patents)

5.  John C McMillion (3 out of 3 patents)

6.  Douglas W Adams (3 out of 27 patents)

7.  Bruce A Purkey (2 out of 15 patents)

8.  Todd C Westberg (2 out of 4 patents)

9.  James Verdouw (2 out of 2 patents)

10.  Richard S Smith (2 out of 2 patents)

11.  Bryan R Lundbeck (2 out of 2 patents)

12.  Scott R Crerar (1 out of 1 patent)

13.  Gary Humbert (1 out of 5 patents)

14.  Jeffrey L Hauman (1 out of 1 patent)

15.  John P Leahy (1 out of 1 patent)


23 patents:

Company Overview
Auto Meter Products, Inc. is a leading manufacturer specializing in high-performance automotive instrumentation. Based in Sycamore, Illinois, the company develops a wide range of gauges and measurement devices tailored for motorsports and automotive enthusiasts. Their products are designed to provide accurate data for vehicle performance, enhancing the driving experience. With a focus on innovation and quality, Auto Meter continues to be a trusted name in the automotive industry, serving both professional racers and everyday drivers.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Nov 3 2026

23 Patents

#3 in Sycamore, IL

#751 in Illinois

#14,456 in US

#27,744 in the World

Sycamore, IL (US)
Sycamore, IL, United States of America
Forward Citations = 796

24 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Auto Meter Products, Inc.. Retrieved from https://idiyas.com/company/auto-meter-products

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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