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USPTO Data Jan 1 1976 - Oct 6 2026
10 Patents
#67 in Rochester, NY
#1,742 in New York
#29,839 in US
#55,986 in the World
Assa Abloy Fenestration, LLC
Forward Citations = 3
19 inventors:
Rochester, NY, United States of America
Assa Abloy Fenestration, LLC
CIPO Patents = 2
EPO Patents = 1
Trademarks = 19
Forward Citations = 3
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19 inventors (with patents filed for the assignee):
Peter J Minter (4 out of 21 patents)
Wilbur James Kellum, Iii (3 out of 19 patents)
Mark R Baker (3 out of 56 patents)
4. Marc Wesley Fullenwider (2 out of 7 patents)
5. Jacob Baitx (2 out of 4 patents)
6. Mark Conrad Jones (2 out of 29 patents)
7. Patrick E Milligan (1 out of 9 patents)
8. Andrew Baglio (1 out of 3 patents)
9. Richard S deNormand (1 out of 18 patents)
10. Eric Mertz (1 out of 2 patents)
11. Matthew N Brady (1 out of 1 patent)
12. James M Mcinnis (1 out of 1 patent)
13. James David Card (1 out of 1 patent)
14. Mark Thomas Halecki (1 out of 1 patent)
15. Jay Sofianek (1 out of 1 patent)
10 patents:
Company Overview
Assa Abloy Fenestration, LLC, based in Rochester, NY, specializes in the development and manufacturing of advanced fenestration solutions. The company focuses on innovative door and window hardware, enhancing security, accessibility, and energy efficiency in residential and commercial applications. With a commitment to quality and sustainability, Assa Abloy Fenestration integrates cutting-edge technology into its products, catering to a diverse range of architectural needs across various markets.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Assa Abloy Fenestration, LLC. Retrieved from https://idiyas.com/company/assa-abloy-fenestration
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
2 patents (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]