logo

For the Inventor, By the Inventor

Vancouver, WA, United States of America

Antares Advanced Test Technologies, Inc.


USPTO Granted Patents = 3

% Expired Patents = 66.7

Forward Citations = 29

Loading Chart...
Loading Chart...

7 inventors (with patents filed for the assignee):

goldMedal Rakesh Batish (1 out of 3 patents)

silverMedal John Shuhart (1 out of 4 patents)

bronzeMedal Timothy L Kraynak (1 out of 7 patents)

4.  Richard M Pointer (1 out of 1 patent)

5.  Steve Fahrner (1 out of 4 patents)

6.  Jim Jaquette (1 out of 1 patent)

7.  Gene Tokraks (1 out of 3 patents)


3 patents:

1. 7402051 - Interconnect assembly for testing integrated circuit packages (2008-07-22),
2. 7297004 - Crimped tube electrical test socket pin (2007-11-20),
3. 7217139 - Interconnect assembly for a probe card (2007-05-15),
logo

Company Badge

USPTO Data Jan 1 1976 - Sep 29 2026

3 Patents

#71 in Vancouver, WA

#1,808 in Washington

#73,766 in US

Vancouver, WA (US)
Vancouver, WA, United States of America

Antares Advanced Test Technologies, Inc.

Forward Citations = 29

7 inventors:

goldMedal Rakesh Batish (1 out of 3 patents)

silverMedal John Shuhart (1 out of 4 patents)

bronzeMedal Timothy L Kraynak (1 out of 7 patents)

4.  Richard M Pointer (1 out of 1 patent)

5.  Steve Fahrner (1 out of 4 patents)

Please report any incorrect information to [email protected]
Loading…