Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
9 Patents
#9 in Tucker, GA
#634 in Georgia
#32,605 in US
Altea Technologies, Inc.
Forward Citations = 2,827
12 inventors:
Tucker, GA, United States of America
Altea Technologies, Inc.
Calculating rank
% Expired Patents = 11.1
Forward Citations = 2,827
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12 inventors (with patents filed for the assignee):
Michael R Hatch (7 out of 17 patents)
Jonathan Eppstein (5 out of 27 patents)
Jonathan A Eppstein (4 out of 14 patents)
4. Krishna Kumar (3 out of 10 patents)
5. Difei Yang (2 out of 6 patents)
6. Danny F Lincoln (1 out of 10 patents)
7. Alan Smith (1 out of 13 patents)
8. David Farquhar (1 out of 8 patents)
9. Stuart McRae (1 out of 12 patents)
10. Mark L Faupel (1 out of 16 patents)
11. Harry K Delcher (1 out of 1 patent)
12. Joseph Papp (1 out of 4 patents)
9 patents:
3. 6918874 - Attribute compensation for analyte detection and/or continuous monitoring (2005-07-19),
Company Overview
Altea Technologies, Inc. is a leading provider of innovative solutions in the tech industry. With a focus on cutting-edge technology and superior customer service, Altea Technologies offers a wide range of services including IT consulting, software development, and cybersecurity solutions. The company is dedicated to helping businesses stay ahead in the digital age through their advanced and customized technology solutions.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Altea Technologies, Inc.. Retrieved from https://idiyas.com/company/altea-technologies
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]