For the Inventor, By the Inventor

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Advantest Coprporation

USPTO Granted Patents = 4

Forward Citations = 43

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12 inventors (with patents filed for the assignee):

Yuji Ogata (1 out of 29 patents)

Kenji Yoshida (1 out of 86 patents)

Takeshi Tanaka (1 out of 64 patents)

4. Tomoaki Ueda (1 out of 45 patents)

5. Yoshiyuki Hata (1 out of 12 patents)

6. Takashi Naito (1 out of 98 patents)

7. Toshiaki Hayakawa (1 out of 10 patents)

8. Katsuhiko Sakamoto (1 out of 7 patents)

9. Kazunari Suga (1 out of 11 patents)

10. Shigeru Murayama (1 out of 9 patents)

11. Takashi Masaki (1 out of 5 patents)

12. Kenichi Fujisaki (1 out of 23 patents)

4 patents: Sort by Forward Citations

1. 10575738 - Magnetic field measurement apparatus and method for noise environment (2020-03-03),

2. 6292005 - Probe card for IC testing apparatus (2001-09-18),

3. 6184698 - Semiconductor component mounting apparatus (2001-02-06),

4. 5831989 - Memory testing apparatus (1998-11-03),

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USPTO Data Jan 1 1976 - Jan 6 2026

4 Patents

#2,781 in Tokyo

#7,421 in Japan

Advantest Coprporation

Forward Citations = 43

12 inventors:

Yuji Ogata (1 out of 29 patents)

Kenji Yoshida (1 out of 86 patents)

Takeshi Tanaka (1 out of 64 patents)

4. Tomoaki Ueda (1 out of 45 patents)

5. Yoshiyuki Hata (1 out of 12 patents)

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