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USPTO Data Jan 1 1976 - Oct 20 2026
11 Patents
#44 in Tampa, FL
#810 in Florida
#27,529 in US
#51,801 in the World
Advanced Training System LLC
Forward Citations = 15
14 inventors:
Tampa, FL, United States of America
Advanced Training System LLC
Forward Citations = 15
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14 inventors (with patents filed for the assignee):
Reginald T Welles (9 out of 13 patents)
Darrell R Turpin (9 out of 13 patents)
Aaron J Turpin (9 out of 13 patents)
4. J Ken Barton (7 out of 12 patents)
5. David J Havell (7 out of 15 patents)
6. James W Voorhees (7 out of 10 patents)
7. Camille B Price (7 out of 9 patents)
8. Nathan P Stahlman (7 out of 10 patents)
9. Aaron M Purvis (7 out of 10 patents)
10. Aaron Michael Best (7 out of 15 patents)
11. John Kearney, Sr (3 out of 5 patents)
12. John E Kearney (3 out of 3 patents)
13. Enrique Mar (2 out of 2 patents)
14. John Kearney Sr (1 out of 1 patent)
11 patents:
5. 10325512 - System, method and apparatus for driver training system with dynamic mirrors (2019-06-18),
Company Overview
Advanced Training System LLC, based in Tampa, FL, specializes in the development of innovative training solutions and technologies. The company focuses on enhancing learning experiences through advanced simulation and instructional design, catering to various sectors including defense, healthcare, and corporate training. By leveraging cutting-edge methodologies and tools, Advanced Training System LLC aims to improve skill acquisition and retention, ensuring effective training outcomes for its clients.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Advanced Training System LLC. Retrieved from https://idiyas.com/company/advanced-training-system
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]