Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
10 Patents
#32 in Ibaraki
#4,401 in Japan
#56,047 in the World
Advanced Technology Research Corporation
Forward Citations = 296
20 inventors:
Advanced Technology Research Corporation
Trademarks = 3
Forward Citations = 296
Loading Chart...
Loading Chart...
20 inventors (with patents filed for the assignee):
Robert Dana Lundahl (5 out of 16 patents)
Dwight R Koogle (3 out of 7 patents)
Mark G Bankard (2 out of 11 patents)
4. Robert Cutlip (2 out of 2 patents)
5. Crystal Yannuzzi (2 out of 2 patents)
6. Matthew Fontaine (2 out of 2 patents)
7. Isao Shimizu (1 out of 31 patents)
8. Gibert H Lovell (1 out of 1 patent)
9. Eric Chi-Kai Hui (1 out of 1 patent)
10. Merrill Keith Umbreit (1 out of 1 patent)
11. Richard C Lazzara (1 out of 4 patents)
12. Mark Klemick (1 out of 1 patent)
13. Takahiro Saito (1 out of 4 patents)
14. Anthony J Barbera (1 out of 1 patent)
15. Thomas J Stansfield (1 out of 1 patent)
10 patents:
Company Overview
Advanced Technology Research Corporation, based in Ibaraki, Japan, specializes in the development of cutting-edge technologies across various domains. The organization focuses on advanced research in fields such as robotics, automation, and artificial intelligence, aiming to enhance industrial efficiency and innovation. With a commitment to pushing the boundaries of technology, ATRC collaborates with various sectors to deliver solutions that address complex challenges and drive progress in the technological landscape.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Advanced Technology Research Corporation. Retrieved from https://idiyas.com/company/advanced-technology-research
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]