Ankeny, IA, United States of America

Advanced Analytical Technologies, Inc.


USPTO Granted Patents = 16

% Expired Patents = 6.3

Trademarks = 4

Forward Citations = 68

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19 inventors (with patents filed for the assignee):

goldMedal Wei Wei (6 out of 10 patents)

silverMedal Ho-ming Pang (6 out of 11 patents)

bronzeMedal Robert Czarnek (4 out of 24 patents)

4.  Bruce R Boeke (3 out of 8 patents)

5.  James D Morrow (2 out of 52 patents)

6.  Daniel A Buttry (1 out of 31 patents)

7.  Martin Chris Foster (1 out of 6 patents)

8.  Thomas J Kurt (1 out of 9 patents)

9.  Michael Stebniski (1 out of 3 patents)

10.  Scott Stueckradt (1 out of 5 patents)

11.  Thomas D Baugh (1 out of 3 patents)

12.  Jay Edward Locklear (1 out of 12 patents)

13.  Pierre Varineau (1 out of 1 patent)

14.  Steven J Lasky (1 out of 3 patents)

15.  Pang Ho-ming (1 out of 1 patent)


16 patents:

Company Overview
Advanced Analytical Technologies, Inc. is a technology-driven company based in Ankeny, Iowa, specializing in the development and manufacturing of advanced analytical instruments. The organization focuses on providing innovative solutions for various sectors, including life sciences and environmental analysis. With a commitment to enhancing analytical capabilities, it leverages cutting-edge research to deliver high-performance tools that support scientific discovery and regulatory compliance across diverse applications.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

16 Patents

#1 in Ankeny, IA

#113 in Iowa

#19,922 in US

#37,831 in the World

Ankeny, IA (US)
Ankeny, IA, United States of America
Forward Citations = 68

19 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Advanced Analytical Technologies, Inc.. Retrieved from https://idiyas.com/company/advanced-analytical-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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