Forward Citations = 1

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3 inventors (with patents filed for the assignee):

Bulent Mehmet Basol (4 out of 161 patents)

Abhijeet Joshi (4 out of 5 patents)

Jalal Ashjaee (3 out of 23 patents)

4 patents: Sort by Forward Citations

1. 12313669 - Methods and tools for electrical property depth profiling using electro-etching (2025-05-27),

2. 11699622 - Methods and apparatus for test pattern forming and film property measurement (2023-07-11),

3. 11289386 - Methods and apparatus for test pattern forming and film property measurement (2022-03-29),

4. 10790203 - Methods and systems for material property profiling of thin films (2020-09-29),

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

4 Patents

#43 in Scotts Valley, CA

#14,058 in California

#60,671 in US

Scotts Valley, CA, United States of America

Active Layer Parametrics, Inc.

Forward Citations = 1

3 inventors:

Bulent Mehmet Basol (4 out of 161 patents)

Abhijeet Joshi (4 out of 5 patents)

Jalal Ashjaee (3 out of 23 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Active Layer Parametrics, Inc.. Retrieved from https://idiyas.com/company/active-layer-parametrics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]