The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2020

Filed:

May. 28, 2018
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Marinus Aart Van Den Brink, Moergestel, NL;

Jozef Petrus Henricus Benschop, Veldhoven, NL;

Erik Roelof Loopstra, Eindhoven, NL;

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/42 (2005.12); G03B 27/52 (2005.12); G03B 27/58 (2005.12);
U.S. Cl.
CPC ...
G03B 27/42 (2012.12); G03B 27/52 (2012.12); G03B 27/58 (2012.12);
Abstract

The invention relates to a dual stage lithographic apparatus, wherein two substrate stages are constructed and arranged for mutual cooperation in order to perform a joint scan movement. The joint scan movement brings the lithographic apparatus from a first configuration, wherein immersion liquid is confined between a first substrate held by the first stage of the stages and a projection system of the apparatus, to a second configuration, wherein the immersion liquid is confined between a second substrate held by the second stage of the two stages and the projection system, such that during the joint scan movement the liquid is essentially confined within the space with respect to the projection system.


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