The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Apr. 26, 2010
Applicants:

Weilin Gao, Shizuoka, JP;

Tomotsugu Aoyama, Shizuoka, JP;

Hisashi Suda, Shizuoka, JP;

Hiroto Narieda, Shizuoka, JP;

Akira Sugawara, Shizuoka, JP;

Akifumi Onodera, Shizuoka, JP;

Inventors:

Weilin Gao, Shizuoka, JP;

Tomotsugu Aoyama, Shizuoka, JP;

Hisashi Suda, Shizuoka, JP;

Hiroto Narieda, Shizuoka, JP;

Akira Sugawara, Shizuoka, JP;

Akifumi Onodera, Shizuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C22C 9/00 (2006.01); C22C 9/06 (2006.01); C22C 9/10 (2006.01); C22F 1/00 (2006.01); C22F 1/08 (2006.01); H01R 13/03 (2006.01);
U.S. Cl.
CPC ...
C22C 9/06 (2013.01); C22C 9/00 (2013.01); C22F 1/00 (2013.01); C22F 1/08 (2013.01); H01R 13/03 (2013.01);
Abstract

A copper alloy sheet has a chemical composition containing 0.7 to 4.0 wt % of Ni, 0.2 to 1.5 wt % of Si, and the balance being copper and unavoidable impurities, the copper alloy sheet having a crystal orientation which satisfies I{200}/I{200}≥1.0, assuming that the intensity of X-ray diffraction on the {200} crystal plane on the surface of the copper alloy sheet is I{200} and that the intensity of X-ray diffraction on the {200} crystal plane of the standard powder of pure copper is I{200}, and which satisfies I{200}/I{422}≥15, assuming that the intensity of X-ray diffraction on the {422} crystal plane on the surface of the copper alloy sheet is I{422}.


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