The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Oct. 27, 2016
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Siew Kit Hoi, Singapore, SG;

Arvind Sundarrajan, Singapore, SG;

Jiao Song, Singapore, SG;

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01); H01L 21/768 (2006.01); H01L 21/285 (2006.01); H01L 21/67 (2006.01); H01J 37/32 (2006.01); C23C 14/34 (2006.01); C23C 14/16 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76865 (2013.01); C23C 14/165 (2013.01); C23C 14/34 (2013.01); H01J 37/321 (2013.01); H01J 37/32009 (2013.01); H01J 37/3244 (2013.01); H01J 37/32339 (2013.01); H01L 21/2855 (2013.01); H01L 21/67069 (2013.01); H01L 21/76862 (2013.01); H01L 21/76871 (2013.01);
Abstract

Methods for forming layers on a substrate having a feature are provided herein. In some embodiments, a method for forming layers on a substrate having a features may include depositing a copper layer within the feature, wherein a thickness of the copper layer disposed on upper corners of an opening of the feature and on an upper portion of a sidewall proximate the upper corners of the feature is greater than the thickness of the copper layer disposed on a lower portion of a sidewall of the feature proximate a bottom of the feature; and exposing the substrate to a plasma formed from a process gas comprising hydrogen (H) gas to selectively etch the copper layer proximate the upper corners of the opening and the upper portion of the sidewall proximate the upper corners, without substantially etching the copper layer proximate the lower portion of the sidewall proximate the bottom of the feature.


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