The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Oct. 26, 2016
Applicant:

Hitachi Kokusai Electric Inc., Tokyo, JP;

Inventors:

Yukinao Kaga, Toyama, JP;

Arito Ogawa, Toyama, JP;

Atsuro Seino, Toyama, JP;

Atsuhiko Ashitani, Toyama, JP;

Ryohei Maeno, Toyama, JP;

Masanori Sakai, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/285 (2006.01); H01L 21/67 (2006.01); C23C 16/52 (2006.01); H01L 21/673 (2006.01); H01L 21/687 (2006.01); C23C 16/30 (2006.01); C23C 16/44 (2006.01); C23C 16/455 (2006.01); C23C 16/34 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28556 (2013.01); C23C 16/303 (2013.01); C23C 16/34 (2013.01); C23C 16/4412 (2013.01); C23C 16/45527 (2013.01); C23C 16/45546 (2013.01); C23C 16/45557 (2013.01); C23C 16/52 (2013.01); H01L 21/28562 (2013.01); H01L 21/28568 (2013.01); H01L 21/67103 (2013.01); H01L 21/67196 (2013.01); H01L 21/67201 (2013.01); H01L 21/67248 (2013.01); H01L 21/67389 (2013.01); H01L 21/68707 (2013.01); H01L 21/68742 (2013.01); H01L 21/68764 (2013.01); H01L 21/76843 (2013.01);
Abstract

The present invention is provided to improve quality or manufacturing throughput of a semiconductor device. A method includes supplying a source gas to a substrate in a process chamber; exhausting an inside of the process chamber; supplying a reaction gas to the substrate; and exhausting the inside of the process chamber, wherein the source gas and/or the reaction gas is supplied in temporally separated pulses in the supply of the source gas and/or in the supply of the reaction gas. Then, the source gas and/or the reaction gas is supplied in temporally separated pulses to form a film during a gas supply time determined by a concentration distribution of by-products formed on a surface of the substrate.


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