The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Sep. 30, 2016
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Elliot John Smith, Dresden, DE;

Hans-Juergen Thees, Dresden, DE;

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8234 (2006.01); H01L 27/088 (2006.01); H01L 29/51 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823462 (2013.01); H01L 21/823418 (2013.01); H01L 21/823468 (2013.01); H01L 27/0883 (2013.01); H01L 29/518 (2013.01);
Abstract

The present disclosure provides a method of forming a semiconductor device structure including forming a first gate stack comprising a first gate dielectric material and a first gate electrode material over a first active region in an upper portion of a substrate, forming a first spacer structure adjacent to the first gate stack, and forming first raised source/drain (RSD) regions at opposing sides of the first gate stack on the first active region in alignment with the first spacer structure. Herein, forming the first spacer structure includes forming a first spacer structure on sidewalls of the first gate stack, the first gate dielectric extending in between the first spacer and the upper surface portion, patterning the first gate dielectric material, and forming a second spacer over the first spacer and the patterned first gate dielectric material.


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