The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Sep. 11, 2015
Applicant:
Freescale Semiconductor, Inc., Austin, TX (US);
Inventors:
Assignee:
NXP USA, INC., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/10 (2006.01); G01R 31/3185 (2006.01); G06F 1/26 (2006.01);
U.S. Cl.
CPC ...
G06F 1/10 (2013.01); G01R 31/318544 (2013.01); G01R 31/318552 (2013.01);
Abstract
An integrated circuit receives test-control information that is phase encoded on a scan clock used for testing a scan chain within the IC. The phase encoding does not affect the normal use of the scan clock and scan test chain and allows additional test-related data such as power supply, clock, and additional global and specialized status data to be collected by a secondary test data storage system such as a shift register. The phase encoding further controls selectively outputting the enhanced test status or the traditional scan test outputs.