The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Jun. 26, 2015
Applicant:

Affymetrix, Inc., Santa Clara, CA (US);

Inventors:

Andrew Sparks, Los Gatos, CA (US);

Michael H. Shapero, Redwood City, CA (US);

Glenn K. Fu, Dublin, CA (US);

Keith W. Jones, Sunnyvale, CA (US);

Assignee:

AFFYMETRIX, INC., Carlsbad, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C07H 21/00 (2006.01); G06F 19/20 (2011.01);
U.S. Cl.
CPC ...
C12Q 1/6883 (2013.01); C12Q 1/6827 (2013.01); G06F 19/20 (2013.01); C12Q 2600/16 (2013.01);
Abstract

Methods for detecting genomic rearrangements are provided. In one embodiment, methods are provided for the use of paired end tags from restriction fragments to detect genomic rearrangements. Sequences from the ends of the fragments are brought together to form ditags and the ditags are detected. Combinations of ditags are detected by an on-chip sequencing strategy that is described herein, using inosine for de novo sequencing of short segments of DNA. In another aspect, translocations are identified by using target specific capture and analysis of the captured products on a tiling array.


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