The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Feb. 12, 2015
Applicant:

Toyota Jidosha Kabushiki Kaisha, Aichi, JP;

Inventors:

Kazuhiko Kusunoki, Nishinomiya, JP;

Kazuhito Kamei, Kitakyushu, JP;

Hironori Daikoku, Susono, JP;

Hidemitsu Sakamoto, Susono, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 19/04 (2006.01); C30B 29/36 (2006.01); C30B 9/12 (2006.01); C30B 19/06 (2006.01); C30B 9/06 (2006.01);
U.S. Cl.
CPC ...
C30B 19/04 (2013.01); C30B 9/06 (2013.01); C30B 9/12 (2013.01); C30B 19/062 (2013.01); C30B 29/36 (2013.01);
Abstract

The production method of an SiC single crystal is a production method of an SiC single crystal by a solution growth process. The production method includes a contact step A, a contact step B, and a growth step. In the contact step A, a partial region of the principal surface is brought into contact with a stored Si—C solution. In the contact step B, a contact region between the principal surface and the stored Si—C solution expands, due to a wetting phenomenon, starting from an initial contact region which is the partial region brought into contact in the contact step A. In the growth step, an SiC single crystal is grown on the principal surface which is in contact with the stored Si—C solution.


Find Patent Forward Citations

Loading…